TEM – Jeol JEM-F200 cFEG

Technical specifications

  • Cold field emission gun
  • 20 bis 200 kV Beschleunigungsspannung
  • Resolution:

TEM, point to point: 0.19 nm
TEM, lattice image: 0.10 nm
STEM-HAADF: 0.14 nm

  • Magnification TEM from x 20 to  x 2.0 M; STEM from x 200 to x 150 M
  • Energy Dispersive X-Ray Spectrometer (EDS)
  • Max. specimen tilt angle: ±80° (with Specimen High Tilting Holder)

Imaging modes

  • HAAF STEM (High-angle annular dark-field scanning transmission electron microscopy)
  • bright-field (BF) & dark-field (DF) TEM and STEM, as well as analysis from various types of detectors
  • 3D-EDS tomography: reconstruction method of three-dimensional internal structures through computer image processing of many projection images, which are acquired from sequential tilt-series images of a specimen

Typical applications

  • Analytics of biological samples
  • Characterization of nanoparticles and layers (EDS)
  • Atomic resolution

Location

Pharmazentrum, PZ U1097