TEM – Jeol JEM-F200 cFEG
Technical specifications
- Cold field emission gun
- 20 bis 200 kV Beschleunigungsspannung
- Resolution:
TEM, point to point: 0.19 nm
TEM, lattice image: 0.10 nm
STEM-HAADF: 0.14 nm
- Magnification TEM from x 20 to x 2.0 M; STEM from x 200 to x 150 M
- Energy Dispersive X-Ray Spectrometer (EDS)
- Max. specimen tilt angle: ±80° (with Specimen High Tilting Holder)
Imaging modes
- HAAF STEM (High-angle annular dark-field scanning transmission electron microscopy)
- bright-field (BF) & dark-field (DF) TEM and STEM, as well as analysis from various types of detectors
- 3D-EDS tomography: reconstruction method of three-dimensional internal structures through computer image processing of many projection images, which are acquired from sequential tilt-series images of a specimen
Typical applications
- Analytics of biological samples
- Characterization of nanoparticles and layers (EDS)
- Atomic resolution
Location
Pharmazentrum, PZ U1097
