SEM – Zeiss GeminiSEM 450

Technical specifications

  • Field emission column (FE-SEM Schottky)
  • Resolution electron beam:
    • 0.7 nm @ 15 kV
    • 1.1 nm @ 500 V and 1 kV
  • Magnification:  12x – 2’000’000x

Detectors and micro analysis

  • SE InLens detector
  • EsB detector, Energy-selective Backscattered detector for SE and BSE detection
  • SE2 detector (Everhart-Thornley)
  • VPSE detector, Variable Presssure Secondary Electron detector for imaging of non-conducting specimens
  • aSTEM detector
  • aBSD detector, annular BackScattered electron Detector for high efficiency and angle selective material characterization
  • Octane Elite detector for light element detection and low kV microanalysis combined with Velocity Pro EDAX’s Electron BackScatter Diffraction (EBSD) camera
  • characterization of Electron Backscatter Diffraction (EBSD) patterns (crystal orientation) within the APEX software platform

Typical applications

  • Imaging and material analysis
  • Crystallographic determination on the nanoscale

Location

Pharmazentrum, U1002

 

GeminiSEM 450