Bruker/JPK NanoWizard 4 (AFM – Atomic Force Microscopy)

Technical specifications

  • Maximum sample size up to 14 cm in diameter and 18 mm thickness
  • Images up to 100 µm in X & Y and 15 µm in Z-height
  • Gas- and liquid cell (HyperDrive™ fluid imaging for high resolution AFM)
  • Temperature control from 15°C to 60°C
  • QI-Mode (High-resolution quantitative imaging)
  • Compatibel with Zeiss inverted microscope

Modes

  • Standard imaging modes: Contact Mode, Tapping Mode
  • Phase Imaging Mode
  • Lateral Force Mode
  • Magnetic Force Microscopy (MFM)
  • Electrostatic Force Microscopy (EFM)
  • Force Spectroscopy (adhesion, elasticity and Youngs Modulus)
  • Force Modulation
  • Kelvin Probe Microscopy (KPFM)
  • Conductive AFM (CAFM)
  • Piezoresponse Force Microscopy (PFM)
  • Nanomanipulation and nanolithography

Typical applications

  • Surface roughness measurements
  • Step height and characterization of surfaces
  • Force spectroscopy of cell structures and biological membranes
  • Viscoelastic mapping of mechanical properties

Location

Biozentrum, Lab U160L