Flex-Axiom Nanosurf (AFM – Atomic Force Microscopy)
Technical specifications
- Maximum sample size up to 100 mm in diameter and 6mm in thickness
- Scan head up to 100 µm in X & Y and 10 µm in Z-height
- Scan head upt to 10 µm in X & Y and 3 µm in Z-height
- Liquid cell
- Temperature control from 20°C to 180°C
Modes
- Static Force Mode, Dynamic Force Mode (Tapping Mode)
- Phase Imaging Mode
- Lateral Force Mode
- Magnetic Force Microscopy (MFM)
- Electrostatic Force Microscopy (EFM)
- Force Spectroscopy (Adhäsion, Elastizität und Youngs Modulus)
- Force Modulation
- Nanomanipulation und Nanolithography
Typical applications
- Roughness measurements on surfaces
- Step height and surface characterization
- Force distance curves on cell structures and stiffness measurements on biological tissues
Location
Department of Physics, Lab 0.17
