Flex-Axiom Nanosurf (AFM – Atomic Force Microscopy)

Technical specifications

  • Maximum sample size up to 100 mm in diameter and 6mm in thickness
  • Scan head up to 100 µm in X & Y and 10 µm in Z-height
  • Scan head upt to 10 µm in X & Y and 3 µm in Z-height
  • Liquid cell
  • Temperature control from 20°C to 180°C

Modes

  • Static Force Mode, Dynamic Force Mode (Tapping Mode)
  • Phase Imaging Mode
  • Lateral Force Mode
  • Magnetic Force Microscopy (MFM)
  • Electrostatic Force Microscopy (EFM)
  • Force Spectroscopy (Adhäsion, Elastizität und Youngs Modulus)
  • Force Modulation
  • Nanomanipulation und Nanolithography

Typical applications

  • Roughness measurements on surfaces
  • Step height and surface characterization
  • Force distance curves on cell structures and stiffness measurements on biological tissues

Location

Department of Physics, Lab 0.17

Nanosurf FlexAFM product page