Flex-Axiom Nanosurf (AFM – Atomic Force Microscopy)

  • AFM modes: contact mode, intermittent (tapping) mode, phase contrast mode, lateral force microscopy, multiple spectroscopy modes, MFM / EFM, lithography modes
  • Standard imaging operating modes applicable in air or in liquid
  • Image size up to 100 µm x 100 µm (XY scan range), Z scan range: 10 µm
  • Sample size limited to 100 mm on sample stage (tip-scanning design)

Nanosurf FlexAFM product page