Bruker Dimension 3100 (AFM – Atomic Force Microscopy)

Technical specifications

• Maximum sample size up to 20 cm in diameter and 12 mm in thickness
• Images up to 90 µm in X & Y and 6 µm in Z-height
• Liquid cell

Modes

• Contact Mode, Tapping Mode
• Lateral Force Mode
• Phase Imaging Mode
• Magnetic Force Microscopy (MFM)
• Electrostatic Force Microscopy (EFM)
• Force Volume

Typical applications

• Characterization of surface roughness
• Step height and topography

Location

Physics Departement, Lab 0.17