Bruker Dimension 3100 (AFM – Atomic Force Microscopy)

Technical specifications

  • Maximum sample size up to 20 cm in diameter and 12 mm in thickness
  • Images up to 90 µm in X & Y and 6 µm in Z-height
  • Liquid cell

Modes

  • Contact Mode, Tapping Mode
  • Lateral Force Mode
  • Phase Imaging Mode
  • Magnetic Force Microscopy (MFM)
  • Electrostatic Force Microscopy (EFM)
  • Force Volume

Typical applications

  • Characterization of surface roughness
  • Step height and topography

Location

Physics Departement, Lab 0.17

 

 

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