The combination is key

Scientists from the SNI network have described how electron diffraction can be used to determine crystal structures efficiently. As part of the Nano Argovia project A3EDPI, the researchers combined an EIGER hybrid pixel detector with a classical electron microscope and calibrated the system to allow the quick and reliable calculation of diffraction data.

Writing in the journal Acta Crystallographica, they describe the results of this interdisciplinary collaboration by researchers from the Paul Scherrer Institute (PSI), the Universities of Basel and Dortmund, ETH Zurich, and Dectris (Baden-Daettwil).

The combination of the pixel detector with the electron microscope was the basis for results that created a positive response from the scientific community.