Bruker/JPK NanoWizard 4 (AFM – Atomic Force Microscopy)

  • Sample size 140mm in diameter and 18mm in thickness; unlimited for large samples due to tip-scanning design
  • Images up to 100 µm x 100 µm (XY scan range), Z scan range: 15 µm
  • High-resolution quantitative imaging made easy through QI-Mode
  • Mechanical and electrical characterization of samples
  • Compatible with inverted microscope
  • Imaging modes: Contact mode with Lateral Force Mode, AC modes with optional Q-control, Phase Imaging, Force Spectroscopy, Fast Force Mapping, Force Modulation, Contact Resonance, Nano Manipulation / Lithography, Kelvin Probe Microscopy, Conductive AFM, Scanning Capacitance Microscopy, Piezo Force Microscopy
  • Measurements possible in air, in liquid (HyperDrive™ fluid imaging for high resolution AFM) or gas, with temperature control from 15°C to 60°C