Crystalline structures made visible – the new TEM/STEM in the Nano Imaging Lab

Our new scanning transmission electron microscope “Jeol JEM-F200 cFEG” has a cold field emission source and an acceleration voltage that is more than twice as high as the previous TEM in our laboratory. This, as well as the ability to scan the wafer-thin sample with the electron beam, make the STEM / TEM in combination […]

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